本论文对机械剥离法制备少层二硫化钼进行了研究，并采用SiO₂/Si基底的机械剥离法制备了少层二硫化钼材料，随后使用光学显微镜、原子力显微镜、拉曼光谱仪对所制备材料的微观表征进行了研究。通过光学显微镜验证了不同层数的二硫化钼材料在光学显微镜下呈不同颜色，随层数变薄颜色从黑青逐渐变为淡蓝色，并通过原子力显微镜和共聚焦激光拉曼光谱仪确认。通过原子力显微镜，观察了样品微观表征，确认了样品表面，利用台阶测量了不同MoS₂样品的厚度。利用拉曼光谱仪对不同层数的MoS₂材料的拉曼信号和拉曼特征峰的变化进行了研究，验证了随着MoS₂层数的增加，其拉曼强度和A₁g峰与E₂g¹峰的峰间距都呈递增的趋势，并对不同温度下的MoS₂材料拉曼特征峰进行了研究，验证了随着测试温度的升高，其 E₂g与 A₁g 拉曼峰发生红移。

This paper studied the preparation of few layer molybdenum disulfide by mechanical exfoliation method, and prepared few layer molybdenum disulfide material using SiO₂/Si substrate mechanical exfoliation method. Subsequently, the microstructure characterization of the prepared material was studied using optical microscopy, atomic force microscopy, and Raman spectroscopy. The different colors of molybdenum disulfide materials with different layers were verified by optical microscopy, and the color gradually changed from black blue to light blue as the layers became thinner. This was confirmed by atomic force microscopy and confocal laser Raman spectroscopy.

Through atomic force microscopy, the microscopic characterization of the sample was observed, and the surface of the sample was confirmed. The thickness of different MoS₂ samples was measured using steps. The changes in Raman signals and characteristic peaks of MoS₂ materials with different layers were studied using a Raman spectrometer. It was verified that as the number of MoS₂ layers increased, the Raman intensity and the peak spacing between A₁g and E₂g¹ peaks both showed an increasing trend. The Raman characteristic peaks of MoS₂ materials at different temperatures were also studied, and it was verified that as the testing temperature increased, both the E₂g and A₁g Raman peaks inside the material shifted red.