串列加速器产生的MeV离子可开展离子辐照和离子束分析研究。通过设计搭建合适的实验靶台，可开展多种离子辐照条件、不同温度等实验条件下的离子辐照和离子束分析工作。离子辐照可以开展材料或器件的辐照效应研究，也可以开展辐照育种和材料表面改性研究；通过离子束分析技术，可以获得样品元素组成（质子激发X射线荧光分析，PIXE）、靶材薄膜厚度（卢瑟福背散射分析,RBS）、缺陷损伤及其演变行为研究（离子激发发光分析,IBIL）等信息。

在站期间的主要工作内容如下：

1.     恢复并改进串列加速器气体离子源，改进外束PIXE分析装置，设计搭建高温辐照靶室；

2.     开展离子辐照应用于CR39固体径迹探测器、太阳电池辐照效应、辐射育种、反应堆材料辐照效应研究；

3.     开展离子束分析研究，利用质子激发X射线荧光分析开展大气颗粒物成分分析、含铅钆共聚物中铅钆比值，有机磁性材料中微量元素等工作；利用卢瑟福背散射技术开展了核反应靶厚度的测量；利用离子激发发光分析技术开展了氧化锌等材料辐照缺陷及其演变行为的原位光谱测量。

MeV ions, produced by Tandem Accelerator , could be applied to the researches of  Ion irradiation and Ion Beam Analysis. By designing and building suitable experimental targets, ion irradiation and ion beam analysis under various ion irradiation conditions and different temperatures can be carried out. Ion irradiation can be used in the study the irradiation effect of materials or devices, as well as irradiation breeding and surface modification of materials. Through ion beam analysis technology, the sample element composition (by Proton induced X-ray emission analysis，PIXE), target film thickness (by Rutherford backscattering analysis,RBS), defect damage and its evolution behavior (by ion beam induced luminescence analysis,IBIL) can be obtained.

  The main work during the postdoctoral research station are as follows:

1. Restore and improve the gas ion source of the Tandem Accelerator, improve the external beam PIXE analysis device, and design and build high-temperature irradiation target chamber;

2. Research on the effects of ion irradiation on CR39 solid track detectors, solar cells, radiation breeding and reactor materials;

3. Conduct ion beam analysis research：using PIXE analysis to carry out atmospheric particulate composition analysis, lead gadolinium ratio in lead gadolinium copolymer, trace elements measurement in organic magnetic materials;The thickness of nuclear reaction target was measured by using RBS technique.In situ spectra measurements of irradiation defects and evolution behaviors of zinc oxide and other materials have been carried out by IBIL analysis.